Experience unmatched flexibility with Proteus platform — integrating high-speed waveform generation, IQ modulation, and signal processing in one scalable system.
Explore Lucid Series – offering 3, 6, and 12 GHz models with exceptional signal purity, rapid switching, and versatile modulation options.
High-voltage amplifiers are key in applications such as vehicle ECU susceptibility testing, multi-phase power system testing, and other applications when hundreds of peak-to-peak voltage is required.
Model A10200 is an ultra-small footprint, ultra wideband, high power amplifier designed for high frequency, high power, signal amplification.
Advanced wideband Software Defined Radio, based on a high-performance system-in-a-module architecture. With high sample rates, wide frequency coverage, and accelerated FPGA processing.
Our Primer will show you how Tabor Electronics can accelerate your design, test and evaluation.
The PXE6410 is a PXIe based 6 based slot Gen 3 x4 chassis, that supports the Tabor Proteus Family of AWG’s and the TE330x family of PXIe RF amplifiers.
The PXE21100 is the fastest PXIe chassis in the industry, with 21 available usable slots, ideal for high density high speed measurement applications.
Micro-Electro-Mechanical Systems (MEMS) are the technology of very small devices. MEMS are made up of components between 1 to 100 micro-meter in size (i.e. 0.001 to 0.1 mm), and MEMS devices generally range in size from 20 micro-meters to a millimeter (i.e. 0.02 to 1.0 mm). They usually consist of a central unit that processes data (the microprocessor) and several components that interact with their surroundings such as micro-mirrors.
The testing of Ethernet-based devices – supporting the 10Base-T, 100Base-TX, and 1000Base-T standards – is defined in the IEEE 802.3-2005 and ANSI X3.263-1995 standards. Support for four test modes is required in the physical layer of the device-under-test (DUT). A disturbing sine wave is required for modes 1 and 4.
I2C (or, Inter-Integrated Circuit) is a 2-wire communications bus used to provide connectivity between microchips on printed circuit boards and in embedded systems. Introduced in the 1980s by Phillips, I2C helps to maximize hardware efficiency and circuit simplicity, and is employed in a wide variety of electronic devices.
Since the mid-1970s, the structural testing of loaded printed circuit boards (PCBs) has relied very heavily on the use of the so-called in-circuit “bed-of-nails” technique. This method of testing makes use of a fixture containing a bed-of-nails to access individual devices on the board through test landing sites or pads laid into the copper interconnect, or at other convenient contact points.
The testing of USB devices, hosts, and hubs is carried out according to the requirements of the USB (Universal Serial Bus) Specification and the USB-IF Compliance Program. USB testing requires the use of probes and additional USB devices.